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Practical work benches

These testers have been developed for universities and schools to teach the techniques of optical measurement. This equipment kit, which can be removed and allow a good approach of the principles and applications of speckle interferometry. The equipment comes with a turnkey software training FA - Fringe Analysis ®.
 

Tester strain and vibration analysis


The opto-mechanical equipment comes with this bench can alternatively set up two separate packages of measures.

a) Measures movements in the plane

This bench can address the two wave interferometry speckle. The assembly shall include a digital camera and a YAG laser whose light output allows the analysis of play beautiful area. The purpose of the test is to see movement in the plane of the surface of a workpiece clamped in a vise, and subsequent derivation of the image, to quantify the constraints in both X and Y directions of the plan.


b) Action plan to travel outside

This bench is based on the principle of TV-holography. The constituent elements are simple and robust, designed for frequent handling. The system is designed for measuring travel off-plane (Z axis) of a part subjected to a force or for the analysis of resonance modes of vibration excited in a room. Thanks to the "averaging" of images, the analysis can highlight the nodal lines with an excellent result.
The simple examples provided are the local deformation of a plate, constrained by a screw thrust, or a plate placed in front of a speaker whose frequency is varied from 0 to 2000 Hz to reveal a dozen ways.



Tester strain


 

Bench vibration analysis












 


Tester form


This assembly has the appearance of a mini-cab: to scan the room is arranged on a turntable and the sensor is placed in its vertical. It consists of a camera and a video projector and is based on the principle of structured light. It measures the deformation of a network of parallel lines projected onto an object and modulated by its relief. Each pixel of the camera provides the measuring point with an uncertainty of about 50 microns.
The device can include a comparison of standard parts by providing mapping differences in shape. Locals can also be drawn on the scanned image of the room.
The point files can also be exported in ASCII format to be used by other software (CAD, reverse engineering, stereolithography ...).

 

Technical Date Sheet "Practical work benches"

Stess AnalysisStess Analysis - PDF - 146.2 ko
Speckle InterferometrySpeckle Interferometry - PDF - 149.9 ko

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